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espace at MMU > Faculties > Faculty of Science and Engineering > Centre for Materials Science Research: Surface Coating and Characterisation Research Group  > Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method

Please use this identifier to cite or link to this item: http://hdl.handle.net/2173/110760
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Title: Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method
Authors: Bardosova, M.
Pemble, Martyn
Povey, I. M.
Tredgold, R. H.
Whitehead, Debra
Citation: Applied physics letters, 2006, vol. 89, no. 9.
Publisher: American Institute of Physics
Issue Date: 28-Aug-2006
URI: http://hdl.handle.net/2173/110760
DOI: 10.1063/1.2339031
Additional Links: http://link.aip.org/link/APPLAB/v89/i9/p093116/s1&Agg=doi
Abstract: The Langmuir-Blodgett method was used to engineer photonic crystal thin films of an AB architecture. Structures were studied by transmittance and reflectance spectroscopies. For an AB structure in which the silica particle diameter B is twice that of A, reflectance features associated with the first order Bragg peak for the “A” domain are only observed when the structure is probed from the A side of the structure. Furthermore, this feature is enhanced in intensity compared to that for a structure consisting solely of A particles. These findings are attributed to a matching of first and second order Bragg processes.
Type: Article
Language: en
Description: Full-text of this article is not available in this e-prints service. This article was originally published [following peer-review] in Applied Physics Letters, published by and copyright American Institute of Physics.
Keywords: Light reflection
Photonic crystals
Thin films
Langmuir-Blodgett films
ISSN: 0003-6951
Appears in Collections: Centre for Materials Science Research: Surface Coating and Characterisation Research Group

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