Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method

2.50
Hdl Handle:
http://hdl.handle.net/2173/110760
Title:
Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method
Authors:
Bardosova, M.; Pemble, Martyn; Povey, I. M.; Tredgold, R. H.; Whitehead, Debra
Citation:
Applied physics letters, 2006, vol. 89, no. 9.
Publisher:
American Institute of Physics
Issue Date:
28-Aug-2006
URI:
http://hdl.handle.net/2173/110760
DOI:
10.1063/1.2339031
Additional Links:
http://link.aip.org/link/APPLAB/v89/i9/p093116/s1&Agg=doi
Abstract:
The Langmuir-Blodgett method was used to engineer photonic crystal thin films of an AB architecture. Structures were studied by transmittance and reflectance spectroscopies. For an AB structure in which the silica particle diameter B is twice that of A, reflectance features associated with the first order Bragg peak for the “A” domain are only observed when the structure is probed from the A side of the structure. Furthermore, this feature is enhanced in intensity compared to that for a structure consisting solely of A particles. These findings are attributed to a matching of first and second order Bragg processes.
Type:
Article
Language:
en
Description:
Full-text of this article is not available in this e-prints service. This article was originally published [following peer-review] in Applied Physics Letters, published by and copyright American Institute of Physics.
Keywords:
Light reflection; Photonic crystals; Thin films; Langmuir-Blodgett films
ISSN:
0003-6951

Full metadata record

DC FieldValue Language
dc.contributor.authorBardosova, M.en
dc.contributor.authorPemble, Martynen
dc.contributor.authorPovey, I. M.en
dc.contributor.authorTredgold, R. H.en
dc.contributor.authorWhitehead, Debraen
dc.date.accessioned2010-09-07T10:50:54Z-
dc.date.available2010-09-07T10:50:54Z-
dc.date.issued2006-08-28-
dc.identifier.citationApplied physics letters, 2006, vol. 89, no. 9.en
dc.identifier.issn0003-6951-
dc.identifier.doi10.1063/1.2339031-
dc.identifier.urihttp://hdl.handle.net/2173/110760-
dc.descriptionFull-text of this article is not available in this e-prints service. This article was originally published [following peer-review] in Applied Physics Letters, published by and copyright American Institute of Physics.en
dc.description.abstractThe Langmuir-Blodgett method was used to engineer photonic crystal thin films of an AB architecture. Structures were studied by transmittance and reflectance spectroscopies. For an AB structure in which the silica particle diameter B is twice that of A, reflectance features associated with the first order Bragg peak for the “A” domain are only observed when the structure is probed from the A side of the structure. Furthermore, this feature is enhanced in intensity compared to that for a structure consisting solely of A particles. These findings are attributed to a matching of first and second order Bragg processes.en
dc.language.isoenen
dc.publisherAmerican Institute of Physicsen
dc.relation.urlhttp://link.aip.org/link/APPLAB/v89/i9/p093116/s1&Agg=doien
dc.subjectLight reflectionen
dc.subjectPhotonic crystalsen
dc.subjectThin filmsen
dc.subjectLangmuir-Blodgett filmsen
dc.titleEnhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett methoden
dc.typeArticleen
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